NXP Semiconductors /MK66F18 /USBPHY /USB1_LOOPBACK_SET

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Interpret as USB1_LOOPBACK_SET

31 2827 2423 2019 1615 1211 87 43 0 0 0 0 0 0 0 0 00 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 (UTMI_TESTSTART)UTMI_TESTSTART 0 (UTMI_DIG_TST0)UTMI_DIG_TST0 0 (UTMI_DIG_TST1)UTMI_DIG_TST1 0 (TSTI_TX_HS_MODE)TSTI_TX_HS_MODE 0 (TSTI_TX_LS_MODE)TSTI_TX_LS_MODE 0 (TSTI_TX_EN)TSTI_TX_EN 0 (TSTI_TX_HIZ)TSTI_TX_HIZ 0 (UTMO_DIG_TST0)UTMO_DIG_TST0 0 (UTMO_DIG_TST1)UTMO_DIG_TST1 0 (TSTI_HSFS_MODE_EN)TSTI_HSFS_MODE_EN 0TSTPKT

Description

USB PHY Loopback Control/Status Register

Fields

UTMI_TESTSTART

This bit enables the USB loopback test.

UTMI_DIG_TST0

Mode control for USB loopback test

UTMI_DIG_TST1

Mode control for USB loopback test

TSTI_TX_HS_MODE

Select HS or FS mode for USB loopback testing

TSTI_TX_LS_MODE

Set to value 1’b1 to choose LS for USB loopback testing, set to value 1’b0 to choose HS or FS mode which is defined by TSTI1_TX_HS

TSTI_TX_EN

Enable TX for USB loopback test.

TSTI_TX_HIZ

Sets TX Hi-Z for USB loopback test.

UTMO_DIG_TST0

This read-only bit is a status bit for USB loopback test results

UTMO_DIG_TST1

This read-only bit is a status bit for USB loopback test

TSTI_HSFS_MODE_EN

Setting this bit field to value 1’b1 will enable the loopback test to dynamically change the packet speed

TSTPKT

Selects the packet data byte used for USB loopback testing in Pulse mode

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